Fix unit tests for NEO: use ECCP256 and detect attestation errors
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-1
@@ -61,7 +61,8 @@ extern "C"
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YKPIV_PIN_LOCKED = -13,
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YKPIV_ARGUMENT_ERROR = -14, //i.e. invalid input argument
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YKPIV_RANGE_ERROR = -15 //i.e. value range error
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YKPIV_RANGE_ERROR = -15, //i.e. value range error
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YKPIV_NOT_SUPPORTED = -16
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} ykpiv_rc;
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typedef void* (*ykpiv_pfn_alloc)(void* alloc_data, size_t size);
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@@ -217,6 +218,7 @@ extern "C"
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#define SW_ERR_INCORRECT_PARAM 0x6a80
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/* this is a custom sw for yubikey */
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#define SW_ERR_INCORRECT_SLOT 0x6b00
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#define SW_ERR_NOT_SUPPORTED 0x6d00
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/* Yubico vendor specific instructions */
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#define YKPIV_INS_SET_MGMKEY 0xff
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