Fix unit tests for NEO: use ECCP256 and detect attestation errors

This commit is contained in:
Trevor Bentley
2017-10-20 12:40:09 +02:00
parent 7177ceda74
commit c07355fefb
4 changed files with 26 additions and 6 deletions
+3 -1
View File
@@ -61,7 +61,8 @@ extern "C"
YKPIV_PIN_LOCKED = -13,
YKPIV_ARGUMENT_ERROR = -14, //i.e. invalid input argument
YKPIV_RANGE_ERROR = -15 //i.e. value range error
YKPIV_RANGE_ERROR = -15, //i.e. value range error
YKPIV_NOT_SUPPORTED = -16
} ykpiv_rc;
typedef void* (*ykpiv_pfn_alloc)(void* alloc_data, size_t size);
@@ -217,6 +218,7 @@ extern "C"
#define SW_ERR_INCORRECT_PARAM 0x6a80
/* this is a custom sw for yubikey */
#define SW_ERR_INCORRECT_SLOT 0x6b00
#define SW_ERR_NOT_SUPPORTED 0x6d00
/* Yubico vendor specific instructions */
#define YKPIV_INS_SET_MGMKEY 0xff